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Fluorescence Spectrometer
Description & Specification
Fluorescence Spectrometer
Categories:
Archaeology Testing Lab
Technical Specifications
Measurable elements: Na to U
Element contents: 1ppm-99.99%
Analysis accuracy: 0.05%
Ability of simultaneous analysis: dozens of elements
Plating thickness: up to 0.01um each layer
Forms of samples: powder, solid and liquid
Measurement time:60s-200s
Tube voltage: 5kv-50kv
Tube current: 50uA-1000uA
Input voltage: AC 110V/220V
Consumed power: 200 W
Ambient temperature: 15-26℃
Ambient humidity: ≤70%
Super large vacuum sample chamber: 600*600*1000mm3
Weight: 280KGS
Standard configurations
Electric-cooling UHRD Detector
I n-built SNE improves the signal processing ability up to 25 times.
Automatic collimator and filter switch
Light Path Enhancement System
In-built high resolution CCD
Enhanced Metal Sensitivity Analyzer
Intelligent full-element analysis software matches with the hardware well
Surface light source
Amplifier circuit
High and low power supplies
X-ray Tube
Multi-variable non-linear regression procedure
Independent matrix effect correction models
Triple safety protection model
Element contents: 1ppm-99.99%
Analysis accuracy: 0.05%
Ability of simultaneous analysis: dozens of elements
Plating thickness: up to 0.01um each layer
Forms of samples: powder, solid and liquid
Measurement time:60s-200s
Tube voltage: 5kv-50kv
Tube current: 50uA-1000uA
Input voltage: AC 110V/220V
Consumed power: 200 W
Ambient temperature: 15-26℃
Ambient humidity: ≤70%
Super large vacuum sample chamber: 600*600*1000mm3
Weight: 280KGS
Standard configurations
Electric-cooling UHRD Detector
I n-built SNE improves the signal processing ability up to 25 times.
Automatic collimator and filter switch
Light Path Enhancement System
In-built high resolution CCD
Enhanced Metal Sensitivity Analyzer
Intelligent full-element analysis software matches with the hardware well
Surface light source
Amplifier circuit
High and low power supplies
X-ray Tube
Multi-variable non-linear regression procedure
Independent matrix effect correction models
Triple safety protection model